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Course Contents

Xray Diffractometer (XRD) UV-Visible ` Ellipsometry Spectroscopy (SE) Vibrating Sample Magnetometer (VSM) Scanning Electron Microscopy (SEM) Atomic Force Microscopy (AFM)

Course Synopsis

X-ray Diffractometer (XRD): X-rays, characteristic X-rays, generation of X-ray, Introduction, Crystal structure, condition of diffraction, working principle, purpose, mode of operation, calculation of peak intensity, effect of crystal grains, effect of crystal size,data analysis. Diamond Software: 3D view of the crystal structure Ellipsometry Spectroscopy (SE): Optical properties of the materials, Introduction of Optical properties,Characterization of optical properties, Ellipsometry Principle and Working, Data Analysis using origin software, Applications, working principle UV-Visible Spectroscopy: Introduction. working principle and its Analysis using origin software Vibrating Sample Magnetometer (VSM): Introduction, magnetic properties, dipoles, magnetic materials, Curie law for paramagnetic materials, The Curie-Weiss Law for ferromagnetic materials, Hysteresis, Remanence, & Coercivity of Ferromagnetic Materials, Magnetoresistance, Colossal Magnetoresistance, Magnetostriction of Ferromagnetic Materials, Magnetic Measurements-Vibrating Sample Magnetometer, VSM Operation principle, Signal detection and processing, VSM sensitivity and noise. General Applications, Background and History, Analysis using origin software Scanning Electron Microscopy (SEM): Working principle of its analysis and advantages. Atomic Force Microscopy (AFM): Working principle, 3 Modes: Contact mode, Non-contact mode, Tapping Mode, Figures of Merit, Advantages of AFM, Biological Applications, Future Work

Course Learning Outcomes

After learning this course the students are able to do: The structural analysis in detail and they can able to make the 3 dimensional view of their samples structure The optical analysis using origin software, they able to draw all graphs and calculate their respective parameters The students are able to analyze the magnetic properties the students are able to explain the surface morphology of the sample using Image J software and WSM software

characterization techniques

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Book Title : optical Properties of solids
Author : Mark Fox
Edition : 2nd
Publisher : SPI Publisher Services, Pondicherry, India Printed in Great Britain

Book Title : Xray diffraction
Author : BD Culity
Edition : 2nd
Publisher : New York. Publisher, Prentice-Hall.

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